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1

AIP Conference Proceedings [Author(s) ICXOM23: International Conference on X-ray Optics and Microanalysis - Upton, NY, USA (14–18 September 2015)] - Polymer compound refractive lenses for hard X-ray nanofocusing

Krywka, Christina, Last, Arndt, Marschall, Felix, Márkus, Ottó, Georgi, Sebastian, Müller, Martin, Mohr, Jürgen

Year:

2016

Language:

english

File:

PDF, 3.40 MB

english, 2016

2

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Confocal micro-optical distance sensor: principle and design

Ruprecht, Aiko K., Pruss, Christof, Tiziani, Hans J., Osten, Wolfgang, Lucke, Peter, Last, Arndt, Mohr, Jurgen, Lehmann, Peter, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.

Year:

2005

Language:

english

File:

PDF, 570 KB

english, 2005

3

[AIP SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation - Daegu (Korea) (28 May-2 June 2006)] AIP Conference Proceedings - X-ray Lenses Fabricated by LIGA Technology

Nazmov, Vladimir, Reznikova, Elena, Last, Arndt, Mohr, Jurgen, Saile, Volker, Simon, Rolf, DiMichiel, Marco

Year:

2007

Language:

english

File:

PDF, 910 KB

english, 2007

4

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Advances in X-Ray/EUV Optics and Components III - Numerical simulations of achromatic x-ray lenses

Umbach, Marion, Nazmov, Vladimir, Simon, Markus, Last, Arndt, Saile, Volker, Goto, Shunji, Khounsary, Ali M., Morawe, Christian

Year:

2008

Language:

english

File:

PDF, 673 KB

english, 2008

5

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Advances in X-Ray/EUV Optics and Components VIII - High-speed photon energy tuning of x-rays with high duty cycle by use of Clessidra prism arrays

Jark, Werner, Last, Arndt, Márkus, Ottó, Khounsary, Ali, Goto, Shunji, Morawe, Christian

Year:

2013

Language:

english

File:

PDF, 408 KB

english, 2013

6

SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Concepts for rapid tuning and switching of x-ray energies

Jark, Werner, Last, Arndt, Juha, Libor, Bajt, Saša, London, Richard, Hudec, René, Pina, Ladislav

Year:

2013

Language:

english

File:

PDF, 590 KB

english, 2013

7

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Sensing - Confocal micro-optical distance sensor for precision metrology

Luecke, Peter, Culshaw, Brian, Mignani, Anna G., Last, Arndt, Mohr, Juergen, Riesenberg, Rainer, Ruprecht, Aiko, Osten, Wolfgang, Tiziani, Hans J., Lehmann, Peter

Year:

2004

Language:

english

File:

PDF, 211 KB

english, 2004

8

Transmission hard X-ray microscope with increased view field using planar refractive objectives and condensers made of SU-8 polymer

Reznikova, Elena, Weitkamp, Timm, Nazmov, Vladimir, Simon, Markus, Last, Arndt, Saile, Volker

Journal:

Journal of Physics Conference Series

Year:

2009

Language:

english

File:

PDF, 826 KB

english, 2009

9

Optical Characterization of an X-ray Zoom Lens

Kornemann, Elisa, Márkus, Ottó, Opolka, Alexander, Sawhney, Kawal, Cecilia, Angelica, Hurst, Mathias, Baumbach, Tilo, Last, Arndt, Mohr, Jürgen

Journal:

Microscopy and Microanalysis

Year:

2018

Language:

english

File:

PDF, 384 KB

english, 2018

10

Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry

Koch, Frieder J., Detlefs, Carsten, Schröter, Tobias J., Kunka, Danays, Last, Arndt, Mohr, Jürgen

Journal:

Year:

2016

Language:

english

File:

PDF, 1.42 MB

english, 2016

11

Hard UV-curable organo-mineral coatings for optical applications

Danièle Blanc, Arndt Last, Janyce Franc, Sophie Pavan, Jean-Luc Loubet

Journal:

Thin Solid Films

Year:

2006

Language:

english

File:

PDF, 700 KB

english, 2006

12

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis

Zdora, Marie-Christine, Thibault, Pierre, Zhou, Tunhe, Koch, Frieder J., Romell, Jenny, Sala, Simone, Last, Arndt, Rau, Christoph, Zanette, Irene

Journal:

Physical Review Letters

Year:

2017

Language:

english

File:

PDF, 781 KB

english, 2017

13

Grid-enhanced X-ray coded aperture microscopy with polycapillary optics

Sowa, Katarzyna M., Last, Arndt, Korecki, Paweł

Journal:

Scientific Reports

Year:

2017

Language:

english

File:

PDF, 1.33 MB

english, 2017

14

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Confocal micro-optical distance sensor: realization and results

Lucke, Peter, Osten, Wolfgang, Gorecki, Christophe, Last, Arndt, Mohr, Jurgen, Novak, Erik L., Ruprecht, Aiko K., Pruss, Christof, Tiziani, Hans J., Osten, Wolfgang, Lehmann, Peter, Schonfelder, Sven

Year:

2005

Language:

english

File:

PDF, 738 KB

english, 2005

15

SPIE Proceedings [SPIE Optical Systems Design - Glasgow, Scotland, United Kingdom (Monday 1 September 2008)] Optical Design and Engineering III - Achromatic x-ray focusing using diffractive and refractive elements

Umbach, Marion, Mazuray, Laurent, Wartmann, Rolf, Nazmov, Vladimir, Simon, Markus, Wood, Andrew, Tissot, Jean-Luc, Last, Arndt, Saile, Volker, Raynor, Jeffrey M.

Year:

2008

Language:

english

File:

PDF, 606 KB

english, 2008

16

Determination of the packing fraction in photonic glass using synchrotron radiation nanotomography

Ogurreck, Malte, do Rosario, Jefferson J., Leib, Elisabeth W., Laipple, Daniel, Greving, Imke, Marschall, Felix, Last, Arndt, Schneider, Gerold A., Vossmeyer, Tobias, Weller, Horst, Beckmann, Felix, M

Journal:

Journal of Synchrotron Radiation

Year:

2016

Language:

english

File:

PDF, 1.46 MB

english, 2016

17

Hybrid setup for micro- and nano-computed tomography in the hard X-ray range

Fella, Christian, Balles, Andreas, Hanke, Randolf, Last, Arndt, Zabler, Simon

Journal:

Review of Scientific Instruments

Year:

2017

Language:

english

File:

PDF, 2.87 MB

english, 2017

18

Viel Farbe aus wenig Licht: Mikrospektrometer

Journal:

Physik in unserer Zeit

Year:

2002

Language:

german

File:

PDF, 110 KB

german, 2002

19

At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis

Zdora, Marie-Christine, Zanette, Irene, Zhou, Tunhe, Koch, Frieder J., Romell, Jenny, Sala, Simone, Last, Arndt, Ohishi, Yasuo, Hirao, Naohisa, Rau, Christoph, Thibault, Pierre

Journal:

Year:

2018

Language:

english

File:

PDF, 8.10 MB

english, 2018

20

Gebündeltes Röntgenlicht: Planare refraktive Röntgenlinsen

Arndt Last, Vladimir Nazmov, Elena Reznikova

Journal:

Physik in unserer Zeit

Year:

2007

Language:

german

File:

PDF, 1.01 MB

german, 2007

21

Simulation of aperture-optimised refractive lenses for hard X-ray full field microscopy

Marschall, Felix, Last, Arndt, Simon, Markus, Vogt, Harald, Mohr, Jürgen

Journal:

Year:

2016

Language:

english

File:

PDF, 1.14 MB

english, 2016

22

Development of an Array of Compound Refractive Lenses for Sub-Pixel Resolution, Large Field of View, and Time-Saving in Scanning Hard X-ray Microscopy

Mamyrbayev, Talgat, Opolka, Alexander, Ershov, Alexey, Gutekunst, Josephine, Meyer, Pascal, Ikematsu, Katsumasa, Momose, Atsushi, Last, Arndt

Journal:

Applied Sciences

Year:

2020

File:

PDF, 1.90 MB

2020

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